Determination of the resistivity anisotropy of orthorhombic materials via transverse resistivity measurements

10 Oct 2016 Walmsley P. Fisher I. R.

Measurements of the resistivity anisotropy can provide crucial information about the electronic structure and scattering processes in anisotropic and low-dimensional materials, but quantitative measurements by conventional means often suffer very significant systematic errors. Here we describe a novel approach to measuring the resistivity anisotropy of orthorhombic materials, using a single crystal and a single measurement, that is derived from a $\frac{\pi}{4}$ rotation of the measurement frame relative to the crystallographic axes... (read more)

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