Machine Learning Identification of Impurities in the STM Images

29 Jun 2020 Wang Ce Li Haiwei Hao Zhenqi Li Xintong Zou Cangwei Cai Peng Wang Yayu You Yi-Zhuang Zhai Hui

In this work we train a neural network to identify impurities in the experimental images obtained by the scanning tunneling microscope measurements. The neural network is first trained with large number of simulated data and then the trained neural network is applied to identify a set of experimental images taken at different voltages... (read more)

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