Quantification of Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy

16 Oct 2016 Balke Nina Jesse Stephen Carmichael Ben Okatan M. Baris Kravchenko Ivan I. Kalinin Sergei V. Tselev Alexander

Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity is harnessed in several AFM imaging modes... (read more)

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  • MESOSCALE AND NANOSCALE PHYSICS