Quantifying Defects in Thin Films using Machine Vision

10 Mar 2020 Taherimakhsousi Nina MacLeod Benjamin P. Parlane Fraser G. L. Morrissey Thomas D. Booker Edward P. Dettelbach Kevan E. Berlinguette Curtis P.

The sensitivity of thin-film materials and devices to defects motivates extensive research into the optimization of film morphology. This research could be accelerated by automated experiments that characterize the response of film morphology to synthesis conditions... (read more)

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  • APPLIED PHYSICS
  • IMAGE AND VIDEO PROCESSING