Using Cerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence
13 Jan 2020
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Stöger-Pollach Michael
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Löffler Stefan
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Maurer Niklas
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Bukvisova Kristyna
Cathodoluminescence (CL) has evolved into a standard analytical technique in
(scanning) transmission electron microscopy. CL utilizes light excited due to
the interactions between the electron-beam and the sample...In the present study
we focus on Cerenkov radiation. We make use of the fact that the electron
transparent specimen acts as a Fabry-P\'erot interferometer for coherently
emitted radiation. From the wavelength dependent interference pattern of
thickness dependent measurements we calculate the refractive index of the
studied material. We describe the limits of this approach and compare it with
the determination of the refractive index by using valence electron energy loss
spectrometry (VEELS)(read more)