Fabrication of sharp atomic force microscope probes using in-situ local electric field induced deposition under ambient conditions

11 Oct 2016 Temiryazev Alexei Bozhko Sergey I. Robinson A. Edward Temiryazeva Marina

We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized electric field in the air gap between the probe tip and the surface of conductive sample... (read more)

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  • MESOSCALE AND NANOSCALE PHYSICS