Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets

19 Dec 2018  ·  Zeb Johar, Ali Shad, Haneef Muhammad, Naeem Azhar Muhammad, Akbar Jehan ·

This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-\`a-vis titanium, copper and iron base alloys were used for the study due to their availability... The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement. read more

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Instrumentation and Detectors Materials Science