no code implementations • 8 Oct 2023 • Sergei V. Kalinin, Yongtao Liu, Arpan Biswas, Gerd Duscher, Utkarsh Pratiush, Kevin Roccapriore, Maxim Ziatdinov, Rama Vasudevan
Machine learning methods are progressively gaining acceptance in the electron microscopy community for de-noising, semantic segmentation, and dimensionality reduction of data post-acquisition.