no code implementations • 5 May 2021 • Shihao Song, Jui Hanamshet, Adarsha Balaji, Anup Das, Jeffrey L. Krichmar, Nikil D. Dutt, Nagarajan Kandasamy, Francky Catthoor
We propose a new architectural technique to mitigate the aging-related reliability problems in neuromorphic systems, by designing an intelligent run-time manager (NCRTM), which dynamically destresses neuron and synapse circuits in response to the short-term aging in their CMOS transistors during the execution of machine learning workloads, with the objective of meeting a reliability target.